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IPC 7
  H01J 27/00 - H01J 31/68  
H01J03300-H01J04020
  H01J 41/00 - H01J 65/08  

SECTION H – ELECTRICITY


H 01BASIC ELECTRIC ELEMENTS


H 01 JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; arc lamps with consumable electrodes H05B; particle accelerators H05H)


33/

00Discharge tubes with provision for emergence of electrons or ions from the vessel (particle accelerators H05H); Lenard tubes

33/

02.Details

33/

04..Windows


35/

00X-ray tubes (X-ray lasers H01S 4/00; X-ray technique in general H05G)

35/

02.Details

35/

04..Electrodes

35/

06...Cathodes

35/

08...Anodes; Anticathodes

35/

10....Rotary anodes; Arrangements for rotating anodes; Cooling rotary anodes

35/

12....Cooling non-rotary anodes

35/

14..Arrangements for concentrating, focusing, or directing the cathode ray

35/

16..Vessels; Containers; Shields associated therewith

35/

18...Windows

35/

20..Selection of substances for gas fillings; Means for obtaining or maintaining the desired pressure within the tube, e.g. by gettering

35/

22.specially designed for passing a very high current for a very short time, e.g. for flash operation

35/

24.Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof

35/

26..by rotation of the anode or anticathode

35/

28..by vibration, oscillation, reciprocation, or swash-plate motion of the anode or anticathode

35/

30..by deflection of the cathode ray

35/

32.Tubes wherein the X-rays are produced at or near the end of the tube or a part thereof, which tube or part has a small cross-section to facilitate introduction into a small hole or cavity


37/

00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (H01J 33/00, H01J 40/00, H01J 41/00, H01J 47/00, H01J 49/00 take precedence; investigating or analysing surface structures in atomic ranges using scanning-probe techniques G01N 13/10, e.g. scanning tunnelling microscopy G01N 13/12; contactless testing of electronic circuits using electron beams G01R 31/305; details of scanning-probe apparatus, in general G12B 21/00) [2,5]

37/

02.Details

37/

04..Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement

37/

05...Electron- or ion-optical arrangements for separating electrons or ions according to their energy (particle separator tubes H01J 49/00)  [3]

37/

06...Electron sources; Electron guns

37/

063....Geometrical arrangement of electrodes for beam-forming  [3]

37/

065....Construction of guns or parts thereof (H01J 37/067 to H01J 37/077 take precedence)  [3]

37/

067....Replacing parts of guns; Mutual adjustment of electrodes (H01J 37/073 to H01J 37/077 take precedence; vacuum locks H01J 37/18)  [3]

37/

07....Eliminating deleterious effects due to thermal effects or electric or magnetic fields (H01J 37/073 to H01J 37/077 take precedence)  [3]

37/

073....Electron guns using field emission, photo emission, or secondary emission electron sources  [3]

37/

075....Electron guns using thermionic emission from cathodes heated by particle bombardment or by irradiation, e.g. by laser  [3]

37/

077....Electron guns using discharge in gases or vapours as electron sources  [3]

37/

08...Ion sources; Ion guns

37/

09...Diaphragms; Shields associated with electron- or ion-optical arrangements; Compensation of disturbing fields  [3]

37/

10...Lenses

37/

12....electrostatic

37/

14....magnetic

37/

141.....Electromagnetic lenses  [3]

37/

143.....Permanent magnetic lenses  [3]

37/

145....Combinations of electrostatic and magnetic lenses  [3]

37/

147...Arrangements for directing or deflecting the discharge along a desired path (lenses H01J 37/10)  [2]

37/

15....External mechanical adjustment of electron- or ion-optical components (H01J 37/067, H01J 37/20 take precedence)  [3]

37/

153...Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators  [2]

37/

16..Vessels; Containers

37/

18..Vacuum locks

37/

20..Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support (preparing specimens for investigation G01N 1/28)

37/

21..Means for adjusting the focus  [2]

37/

22..Optical or photographic arrangements associated with the tube

37/

24..Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for

37/

244..Detectors; Associated components or circuits therefor  [3]

37/

248..Components associated with high voltage supply (high voltage supply in general H02J, H02M)  [3]

37/

252.Tubes for spot-analysing by electron or ion beams; Microanalysers (investigating or analysing thereby G01N 23/22)  [3]

37/

256..using scanning beams  [3]

37/

26.Electron or ion microscopes; Electron- or ion-diffraction tubes  [2]

37/

27..Shadow microscopy  [3]

37/

28..with scanning beams (microanalysers using scanning beams H01J 37/256)

37/

285..Emission microscopes, e.g. field-emission microscopes  [2]

37/

29..Reflection microscopes  [2]

37/

295..Electron- or ion-diffraction tubes  [2]

37/

30.Electron-beam or ion-beam tubes for localised treatment of objects

37/

301..Arrangements enabling beams to pass between regions of different pressure  [3]

37/

302..Controlling tubes by external information, e.g. programme control (H01J 37/304 takes precedence)  [3]

37/

304..Controlling tubes by information coming from the objects, e.g. correction signals  [3]

37/

305..for casting, melting, evaporating, or etching  [2]

37/

31..for cutting or drilling  [2]

37/

315..for welding  [2]

37/

317..for changing properties of the objects or for applying thin layers thereon, e.g. ion implantation (H01J 37/36 takes precedence)  [3]

37/

32.Gas-filled discharge tubes (heating by discharge H05B)

37/

34..operating with cathodic sputtering (H01J 37/36 takes precedence)  [3]

37/

36..for cleaning surfaces while plating with ions of materials introduced into the discharge, e.g. introduced by evaporation  [3]


40/

00Photoelectric discharge tubes not involving the ionisation of a gas (H01J 49/00 takes precedence; cathode-ray or image-pick-up tubes H01J 31/26) [3]

40/

02.Details  [3]

40/

04..Electrodes  [3]

40/

06...Photo-emissive cathodes  [3]

40/

08..Magnetic means for controlling discharge  [3]

40/

10..Selection of substances for gas fillings  [3]

40/

12..One or more circuit elements structurally associated with the tube  [3]

40/

14..Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for  [3]

40/

16.having photo-emissive cathode, e.g. alkaline photoelectric cell (operating with secondary emission H01J 43/00)  [3]

40/

18..with luminescent coatings for influencing the sensitivity of the tube, e.g. by converting the input wavelength (image-conversion or image-amplification tubes H01J 31/50)  [3]

40/

20..wherein a light-ray scans a photo-emissive screen  [3]

  H01J 27/00 - H01J 31/68    H01J 41/00 - H01J 65/08  
 

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