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IPC 7
G12-G12B02124

SECTION G – PHYSICS


G 12INSTRUMENT DETAILS


G 12 BDETAILS OF INSTRUMENTS, OR COMPARABLE DETAILS OF OTHER APPARATUS, NOT OTHERWISE PROVIDED FOR


Notes

(1)This subclass covers only details which are not restricted to measuring instruments or to any other apparatus covered by a single class.

(2)This subclass does not cover:

 details covered by any other subclass in section A, F, G or H. In particular, details restricted to the measuring instruments are covered by the relevant subclasses of class G01, e.g. G01D;

 constructional details restricted to electric apparatus, e.g. casings, screenings, which are covered by subclass H05K or the relevant subclass in section H.

(3)Attention is drawn to the Notes following the title of section G, especially as regards to the definition of the term "measuring" in Note (2) following the title of class G01.


Subclass Index

SENSITIVE ELEMENTS PRODUCING MOVEMENT OR DISPLACEMENT; DETAILS OF MOVEMENTS 

G12B 1/00; G12B 3/00 

ADJUSTING POSITION OR ATTITUDE; COMPENSATING FOR TEMPERATURE EFFECTS 

G12B 5/00; G12B 7/00 

HOUSING, SUPPORTING; INDICATING ELEMENTS 

G12B 9/00; G12B 11/00 

CALIBRATING 

G12B 13/00 

COOLING; SCREENING 

G12B 15/00; G12B 17/00 

DETAILS OF APPARATUS USING SCANNING-PROBE TECHNIQUES 

G12B 21/00 



1/

00Sensitive elements capable of producing movement or displacement for purposes not limited to measurement; Associated transmission mechanisms therefor

1/

02.Compound strips or plates, e.g. bimetallic (thermometers using bimetallic elements G01K 5/62)

1/

04.Hollow bodies having parts which are deformable or displaceable under pressure, e.g. Bourdon tube, bellows (bellows in general F16J 3/00)


3/

00Details of movements not otherwise provided for (details of apparatus using scanning-probe techniques G12B 21/00; damping of shock or vibrations in general F16F; avoiding out-of-balance forces F16F 15/00; testing balance G01M) [1,7]

3/

02.Caging of movements, i.e. locking of movements when not in use

3/

04.Suspensions (bearings F16C)

3/

06.Reducing effects of friction, e.g. by vibration (by lubrication F16N)

3/

08.Damping of movements, e.g. to promote rapid non-oscillatory movement to a final reading

3/

10..using eddy currents


5/

00Adjusting position or attitude, e.g. level, of instruments or other apparatus, or of parts thereof (levels per se G01C 9/00); Compensating for the effects of tilting or acceleration, e.g. for optical apparatus


7/

00Compensating for the effects of temperature (by cooling G12B 15/00)


9/

00Housing or supporting of instruments or other apparatus

9/

02.Casings; Housings; Cabinets (sealing arrangements for transmission members F16J, particularly F16J 15/50)

9/

04..Details, e.g. cover

9/

06...Metal casings

9/

08.Supports; Devices for carrying

9/

10..Instrument boards; Panels; Desks; Racks; Frameworks


11/

00Indicating elements; Illumination thereof

11/

02.Scales; Dials

11/

04.Pointers; Setting-mechanisms therefor


13/

00Calibrating of instruments or apparatus (calibrating of measuring instruments G01)


15/

00Cooling (by refrigeration, e.g. circulation of refrigerated fluid, F25D; heat-exchange or heat-transfer details of general application F28F)

15/

02.by closed-cycle fluid-circulating systems

15/

04.by currents of fluid, e.g. air, in open cycle

15/

06.by contact with heat-absorbing or radiating masses, e.g. heat-sink


17/

00Screening (insulation or other protection of buildings E04B; emergency protection of apparatus in general F16P 7/00; in connection with acoustic waves G10K 11/00; in connection with nuclear radiation G21F)

Note

 This group covers:

 the protection of instruments or other apparatus from external radiation or other influences;

 the prevention of the emission of undesirable radiation or other influences by instruments or other apparatus.

17/

02.from electric or magnetic fields, e.g. radio waves

17/

04.from ultra-violet, visible, or infra-red light (screening of lighting devices F21V; optical filters G02B 5/20)

17/

06.from heat (G12B 17/04 takes precedence; cooling G12B 15/00)

17/

08.from influences producing mechanical damage, e.g. caused by blast, by external object, by person (G12B 17/02 to G12B 17/06 take precedence)


21/

00Details of apparatus using scanning-probe techniques [7]

 

Notes

(1)In this group the following expression is used with the meaning indicated: [7]

 "probe" means an interfacing device, e.g. a needle with a sharp tip, defining a transducing zone where an interaction, e.g. generation of a tunnelling current when in close proximity to a surface, is supported. [7]

(2)Attention is drawn to the Notes following the titles of class B81 and subclass B81B relating to "micro-structural devices" and "micro-structural systems" and the Notes following the title of subclass B82B relating to "nano-structures". [7]

(3)The following is a list of places where specific applications using scanning-probe techniques are provided for: [7]

 B82B 3/00  Manufacture or treatment of nano-structures [7] 

 C23C  Surface treatment of metallic material [7] 

 G01B  Dimensional measurement [7] 

 G01N 13/10  Investigating or analysing surface structures in atomic ranges [7] 

 G11B 9/12

 G11B 11/24

 G11B 13/08  Recording or reproducing information [7] 

 H01J 37/00  Discharge tubes with provision for introducing objects or material to be exposed to the discharge [7] 

 H01L  Processes or apparatus adapted for the treatment of semiconductors or solid state devices [7] 

21/

02.Probes [7]

 

21/

04..Tunnel effect probes [7]

 

21/

06..Near-field optical probes [7]

 

21/

08..Atomic force probes [7]

 

21/

10..Magnetic force probes [7]

 

21/

12..Electrostatic force probes [7]

 

21/

20.Scanning or positioning arrangements [7]

 

21/

22..Structural details [7]

 

21/

24..Compensation for temperature or vibration induced errors [7]

 

  
 

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