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IPC 7
  G01R 13/00 - G01R 21/14  
G01R02200-G01R03144
  G01R 33/00 - G01R 35/06  

SECTION G – PHYSICS


G 01MEASURING (counting G06M); TESTING


G 01 RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (measuring physical variables of any kind by conversion into electric variables, see Note (4) following the title of class G01; measuring diffusion of ions in an electric field, e.g. electrophoresis, electro-osmosis, G01N; investigating non-electric or non-magnetic properties of materials by using electric or magnetic methods G01N; indicating correct tuning of resonant circuits H03J 3/12; monitoring electronic pulse counters H03K 21/40; monitoring operation of communication systems H04)


22/

00Arrangements for measuring time integral of electric power or current, e.g. by electronic methods (electromechanical arrangements G01R 11/00; monitoring electric consumption of electrically-propelled vehicles B60L 3/00) [4]

Note

 An arrangement for measuring time integral of electric power is classified in group G01R 21/00 if the essential characteristic is the measuring of electric power.  [4]

22/

02.by electrolytic methods  [4]

22/

04.by calorimetric methods  [4]


23/

00Arrangements for measuring frequencies; Arrangements for analysing frequency spectra (frequency discriminators H03D)

23/

02.Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage (measuring short time intervals G04F)

23/

04..adapted for measuring in circuits having distributed constants

23/

06..by converting frequency into an amplitude of current or voltage

23/

07...using response of circuits tuned on resonance, e.g. grid-drip meter  [2]

23/

08...using response of circuits tuned off resonance

23/

09...using analogue integrators, e.g. capacitors establishing a mean value by balance of input signals and defined discharge signals or leakage (radiation-measuring instruments in which pulses generated by a radiation detector are integrated G01T 1/15)  [2]

23/

10..by converting frequency into a train of pulses, which are then counted

23/

12..by converting frequency into phase shift

23/

14..by heterodyning; by beat-frequency comparison (generation of oscillations by beating unmodulated signals of different frequencies H03B 21/00)  [2]

23/

15..Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements  [3]

23/

16.Spectrum analysis; Fourier analysis

23/

163..adapted for measuring in circuits having distributed constants  [3]

23/

165..using filters  [3]

23/

167...with digital filters  [3]

23/

17..with optical auxiliary devices  [3]

23/

173..Wobbulating devices similar to swept panoramic receivers (panoramic receivers per se H03J 7/32)  [3]

23/

175..by delay means, e.g. tapped delay lines  [3]

23/

177..Analysis of very low frequencies  [3]

23/

18..with provision for recording frequency spectrum

23/

20..Measurement of non-linear distortion


25/

00Arrangements for measuring phase angle between a voltage and a current or between voltages or currents (measuring power factor G01R 21/00; measuring position of individual pulses in a pulse train G01R 29/02; phase discriminators H03D) [2]

25/

02.in circuits having distributed constants

25/

04.involving adjustment of a phase shifter to produce a predetermined phase difference, e.g. zero difference

25/

06.employing quotient instrument

25/

08.by counting of standard pulses (measuring time intervals G04F)  [2]


27/

00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

27/

02.Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant (by measuring phase angle only G01R 25/00)

27/

04..in circuits having distributed constants

27/

06...Measuring reflection coefficients; Measuring standing-wave ratio

27/

08..Measuring resistance by measuring both voltage and current

27/

10...using two-coil or crossed-coil instruments forming quotient

27/

12....using hand generators, e.g. meggers

27/

14..Measuring resistance by measuring current or voltage obtained from a reference source (G01R 27/16, G01R 27/20, G01R 27/22 take precedence)

27/

16..Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line

27/

18...Measuring resistance to earth

27/

20..Measuring earth resistance; Measuring contact resistance of earth connections, e.g. plates

27/

22..Measuring resistance of fluids (measuring vessels, electrodes therefor G01N 27/07)

27/

26..Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants

27/

28.Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networks; Measuring transient response (in line transmission systems H04B 3/46)

27/

30..with provision for recording characteristics, e.g. by plotting Nyquist diagram

27/

32..in circuits having distributed constants  [2]


29/

00Arrangements for measuring or indicating electric quantities not covered by groups G01R 19/00 to G01R 27/00

29/

02.Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time, duration (of amplitude G01R 19/00; of repetition rate G01R 23/00; of phase difference of two cyclic pulse trains G01R 25/00; monitoring pattern of pulse trains H03K 5/19)  [3]

29/

027..Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values  [3]

29/

033...giving an indication of the number of times this occurs  [3]

29/

04.Measuring form factor, i.e. quotient of root-mean-square value and arithmetic mean of instantaneous value; Measuring peak factor, i.e. quotient of maximum value and root-mean-square value

29/

06.Measuring depth of modulation

29/

08.Measuring electromagnetic field characteristics

29/

10..Radiation diagrams of aerials

29/

12.Measuring electrostatic fields

29/

14..Measuring field distribution

29/

16.Measuring asymmetry of polyphase networks

29/

18.Indicating phase sequence; Indicating synchronism

29/

20.Measuring number of turns; Measuring transformation ratio or coupling factor of windings (calibrating instrument transformers G01R 35/02)

29/

22.Measuring piezo-electric properties

29/

24.Arrangements for measuring quantities of charge (electrostatic instruments G01R 5/28; indicating presence of current G01R 19/15; electrolytic meters, calorimetric meters, for measuring time integral of electric current G01R 22/02, G01R 22/04)  [2]

29/

26.Measuring noise figure; Measuring signal-to-noise ratio  [2]


31/

00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (measuring leads, measuring probes G01R 1/06; indicating electrical condition of switchgear or protective devices H01H 71/04, H01H 73/12, H02B 11/10, H02H 3/04; testing or measuring semiconductors or solid state devices during manufacture H01L 21/66; testing line transmission systems H04B 3/46)

31/

01.Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station (G01R 31/18 takes precedence)  [6]

31/

02.Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection

31/

04..Testing connections, e.g. of plugs, of non-disconnectable joints

31/

06..Testing of electric windings, e.g. for polarity (measuring number of turns, transformation ratio, or coupling factor G01R 29/20)

31/

07..Testing of fuses (means for indicating condition of fuse structurally associated with the fuse H01H 85/30)  [6]

31/

08.Locating faults in cables, transmission lines, or networks (emergency protective circuit arrangements H02H)

31/

10..by increasing destruction at fault, e.g. burning-in by using a pulse generator operating a special programme

31/

11..using pulse-reflection methods

31/

12.Testing dielectric strength or breakdown voltage

31/

14..Circuits therefor

31/

16..Construction of testing vessels; Electrodes therefor

31/

18..Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production

31/

20..Preparation of articles or specimens to facilitate testing

31/

24.Testing of discharge tubes (during manufacture H01J 9/42)  [2]

31/

25..Testing of vacuum tubes  [2]

31/

26.Testing of individual semiconductor devices (measurement of impurity content of materials G01N)  [2]

31/

265..Contactless testing  [6]

31/

27..Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects due to surrounding elements  [6]

31/

28.Testing of electronic circuits, e.g. by signal tracer (testing for short-circuits, discontinuities, leakage or incorrect line connection G01R 31/02; checking computers G06F 11/00; checking static stores for correct operation G11C 29/00)

31/

30..Marginal testing, e.g. by varying supply voltage (marginal testing of computers G06)  [2]

31/

302..Contactless testing (non contact-making probes G01R 1/07)  [5]

31/

303...of integrated circuits (G01R 31/305 to G01R 31/315 take precedence)  [6]

31/

304...of printed or hybrid circuits (G01R 31/305 to G01R 31/315 take precedence)  [6]

31/

305...using electron beams  [5]

31/

306....of printed or hybrid circuits  [6]

31/

307....of integrated circuits  [6]

31/

308...using non-ionising electromagnetic radiation, e.g. optical radiation  [5]

31/

309....of printed or hybrid circuits  [6]

31/

311....of integrated circuits  [6]

31/

312...by capacitive methods  [5]

31/

315...by inductive methods  [5]

31/

316..Testing of analog circuits  [6]

31/

3161...Marginal testing  [6]

31/

3163...Functional testing  [6]

31/

3167..Testing of combined analog and digital circuits  [6]

31/

317..Testing of digital circuits  [6]

31/

3173...Marginal testing  [6]

31/

3177...Testing of logic operation, e.g. by logic analysers  [6]

31/

3181...Functional testing (G01R 31/3177 takes precedence)  [6]

31/

3183....Generation of test inputs, e.g. test vectors, patterns or sequences  [6]

31/

3185....Reconfiguring for testing, e.g. LSSD, partitioning  [6]

31/

3187....Built-in tests  [6]

31/

319....Tester hardware, i.e. output processing circuits  [6]

31/

3193.....with comparison between actual response and known fault-free response  [6]

31/

327.Testing of circuit interrupters, switches or circuit-breakers (structural association with switches H01H)  [6]

31/

333..Testing of the switching capacity of high-voltage circuit-breakers (means for detecting the presence of an arc or discharge in switching devices H01H 9/50, H01H 33/26)  [6]

31/

34.Testing dynamo-electric machines (testing electric windings G01R 31/06; methods or apparatus specially adapted for manufacturing, assembling, maintaining or repairing dynamo-electric machines H02K 15/00)  [3]

31/

36.Apparatus for testing electrical condition of accumulators or electric batteries, e.g. capacity or charge condition (accumulators combined with arrangements for measuring, testing or indicating condition H01M 10/48; circuit arrangements for charging, or depolarising batteries or for supplying loads from batteries H02J 7/00)  [3]

31/

38.Testing of sparking-plugs (testing non-electrical properties G01M 19/02)  [6]

31/

40.Testing power supplies  [6]

31/

42..AC power supplies  [6]

31/

44.Testing lamps (discharge lamps G01R 31/24; structurally associated with light source circuit arrangements for detecting lamp failure H05B 37/03)  [6]

  G01R 13/00 - G01R 21/14    G01R 33/00 - G01R 35/06  
 

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