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Technology Database    Tools MEASURING COMPLEX "OPTIKA"

Measuring Complex "Optika"

Is a Technological Breakthrough in the Field of Optical Measurements

The new complex allows for the measurement of apical focal distances, thickness of optical components along optical axes, distance between principal planes of lens, refractive exponents of optical materials in infra-red and ultra-violet bands of radiation - optical systems parameters, for which methods of direct measurement are not currently available.

The operation of the complex is based on radically new highly accurate methods for measuring optical parameters based on multivariate three-dimensional optical models; these methods have been developed by the author of the present article. The fundamental possibility of measurements with these methods has been confirmed with the help of computer-generated simulation.

There can be no doubt of the possibility of their technical implementation on the basis on the existing element base.

The measuring complex "Optika" has the following advantages:

  • small measuring errors throughout a large range of measured values;
  • high measuring efficiency resulting from automation of the process;
  • a possibility for measuring parameters in any band of the emitting spectrum;
  • a possibility for its association with various interfaces;
  • adjustment, regulation and maintenance convenience;
  • quick switchover to another product size or measurement type.

The use of the complex substantially increases the technological level of optical production and its economic effectiveness. A high degree of unification and standardization is also achieved, ensuring uniformity of measurements. The use of computers for processing and storing measurements information improves the level of operation management and its flexibility. In addition to the measuring complex, desktop compact instruments can also be designed for some types of measurements on the basis of these new methods. Absolute and relative errors which may occur while measuring various optical parameters with new methods as compared to the existing level are set forth in Table.

Source: SciTecLibrary.ru
Publishing date: October 4, 2000

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