Technology Database Tools MEASURING COMPLEX "OPTIKA"
Measuring
Complex "Optika"
Is
a Technological Breakthrough in the Field of Optical Measurements
The new complex allows for the
measurement of apical focal distances, thickness of optical components along
optical axes, distance between principal planes of lens, refractive exponents of
optical materials in infra-red and ultra-violet bands of radiation - optical
systems parameters, for which methods of direct measurement are not currently
available.
The operation of the complex is
based on radically new highly accurate methods for measuring optical parameters
based on multivariate three-dimensional optical models; these methods have been
developed by the author of the present article. The fundamental possibility of
measurements with these methods has been confirmed with the help of
computer-generated simulation.
There can be no doubt of the
possibility of their technical implementation on the basis on the existing
element base.
The measuring complex "Optika"
has the following advantages:
- small measuring errors throughout a large range
of measured values;
- high measuring efficiency resulting from
automation of the process;
- a possibility for measuring parameters in any
band of the emitting spectrum;
- a possibility for its association with various
interfaces;
- adjustment, regulation and maintenance
convenience;
- quick switchover to another product size or
measurement type.
The use of the complex
substantially increases the technological level of optical production and its
economic effectiveness. A high degree of unification and standardization is also
achieved, ensuring uniformity of measurements. The use of computers for
processing and storing measurements information improves the level of operation
management and its flexibility. In addition to the measuring complex, desktop
compact instruments can also be designed for some types of measurements on the
basis of these new methods. Absolute and relative errors which may occur while
measuring various optical parameters with new methods as compared to the
existing level are set forth in Table.

Source: SciTecLibrary.ru
Publishing date: October 4, 2000
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